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Ringing Frequency Extraction Method Based on EMD and FFT for Health Monitoring of Power Transistors
Lei Ren  Chunying Gong
Vol. 19, No. 1, pp. 307-315, Jan. 2019
10.6113/JPE.2019.19.1.307

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  ISSN : 1598 - 2092
eISSN : 2093 - 4718